PROCEDURE: swe_testpulser_model PURPOSE: Creates SWEA Test Pulser Model and generates test pulser signatures in the three main data products (APID's A0, A2, A4). The model is an analytic approximation to the measured test pulser signal. USAGE: swe_testpulser_model INPUTS: KEYWORDS: GROUP: Group parameter (g) that controls energy bin averaging for A0 and A2 products. Does not affect A4. g = 0,1,2 corresponds to averaging 1, 2, or 4 adjacent energy channels. PAM: Pitch angle map structure specifying the anode and deflector bins comprising the PAD. 0 < andx < 15 ; 0 < dndx < 5. pam = {andx:intarr(16), dndx:intarr(16)} RESULT: Structure to hold A0, A2, and A4 test pulser models. $LastChangedBy: dmitchell $ $LastChangedDate: 2014-04-07 20:05:19 -0700 (Mon, 07 Apr 2014) $ $LastChangedRevision: 14775 $ $URL: svn+ssh://thmsvn@ambrosia.ssl.berkeley.edu/repos/spdsoft/trunk/projects/maven/swea/swe_testpulser_model.pro $ CREATED BY: David L. Mitchell 05-28-13 FILE: swe_testpulser_model.pro VERSION: 1.0